Mid-Infrared (MIR) Complex Refractive Index Spectra of Polycrystalline Copper-Nitride Films by IR-VASE Ellipsometry and Their FIB-SEM Porosity
- Márquez, E.
- Blanco, E.
- Mánuel, J.M.
- Ballester, M.
- García-Gurrea, M.
- Rodríguez-Tapiador, M.I.
- Fernández, S.M.
- Willomitzer, F.
- Katsaggelos, A.K.
Zeitschrift:
Coatings
ISSN: 2079-6412
Datum der Publikation: 2024
Ausgabe: 14
Nummer: 1
Art: Artikel
