Mid-Infrared (MIR) Complex Refractive Index Spectra of Polycrystalline Copper-Nitride Films by IR-VASE Ellipsometry and Their FIB-SEM Porosity

  1. Márquez, E.
  2. Blanco, E.
  3. Mánuel, J.M.
  4. Ballester, M.
  5. García-Gurrea, M.
  6. Rodríguez-Tapiador, M.I.
  7. Fernández, S.M.
  8. Willomitzer, F.
  9. Katsaggelos, A.K.
Aldizkaria:
Coatings

ISSN: 2079-6412

Argitalpen urtea: 2024

Alea: 14

Zenbakia: 1

Mota: Artikulua

DOI: 10.3390/COATINGS14010005 GOOGLE SCHOLAR lock_openSarbide irekia editor