Mid-Infrared (MIR) Complex Refractive Index Spectra of Polycrystalline Copper-Nitride Films by IR-VASE Ellipsometry and Their FIB-SEM Porosity

1. Márquez, E.
2. Blanco, E.
3. Mánuel, J.M.
4. Ballester, M.
5. García-Gurrea, M.
6. Rodríguez-Tapiador, M.I.
7. Fernández, S.M.
8. Willomitzer, F.
9. Katsaggelos, A.K.

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DOI: 10.3390/COATINGS14010005 GOOGLE SCHOLAR lock_openOpen access editor

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