Publicaciones en las que colabora con ANDRES YAÑEZ ESCOLANO (10)

2022

  1. Tailoring of AlAs/InAs/GaAs QDs Nanostructures via Capping Growth Rate

    Nanomaterials, Vol. 12, Núm. 14

2020

  1. CDrift: An Algorithm to Correct Linear Drift from A Single High-Resolution STEM Image

    Microscopy and Microanalysis, Vol. 26, Núm. 5, pp. 913-920

2018

  1. Application of super-resolution techniques to transmission electron microscopy images

    Frontiers in Artificial Intelligence and Applications

  2. Correcting sample drift using Fourier harmonics

    Micron, Vol. 110, pp. 18-27

2017

  1. Evaluation of high-quality image reconstruction techniques applied to high-resolution Z-contrast imaging

    Ultramicroscopy, Vol. 182, pp. 283-291

2009

  1. Atomic scale high-angle annular dark field STEM analysis of the N configuration in dilute nitrides of GaAs

    Physical Review B - Condensed Matter and Materials Physics, Vol. 80, Núm. 12

2007

  1. Error quantification in strain mapping methods

    Microscopy and Microanalysis, Vol. 13, Núm. 5, pp. 320-328

  2. The Peak Pairs algorithm for strain mapping from HRTEM images

    Ultramicroscopy, Vol. 107, Núm. 12, pp. 1186-1193

2005

  1. Quantification of the influence of TEM operation parameters on the error of HREM image matching

    14th Conference, April 11-14, 2005, Oxford, UK

2003

  1. On the application of advanced computing techniques for the determination of thickness and defocus from high resolution transmission electron microscopy images

    10th International Ceramics Congress and 3rd Forum on New Materials, Florence, Italy, July 14-18, 2002