Publicaciones en las que colabora con Francisco Javier García López (5)

2018

  1. Comparison of the thickness determined by fresnel contrast and rutherford backscattering spectrometry in ultra-thin layers

    Microscopy of Semiconducting Materials 2003 (CRC Press), pp. 305-308

2009

  1. MEMS solar sensor testing for satellite applications

    PROCEEDINGS OF THE 2009 SPANISH CONFERENCE ON ELECTRON DEVICES

2007

  1. Influence of the yttria content on the mechanical properties of Y2O3-ZrO2 thin films prepared by EB-PVD

    Vacuum, Vol. 81, Núm. 11-12, pp. 1457-1461

2004

  1. Comparison of the thickness determined by Fresnel contrast and Rutherford backscattering spectrometry in ultra-thin layers

    Design and Nature

2003

  1. Comparison of the thickness determined by Fresnel contrast and Rutherford backscattering spectrometry in ultra-thin layers

    MICROSCOPY OF SEMICONDUCTING MATERIALS 2003