Publicaciones en las que colabora con MIRIAM HERRERA COLLADO (18)

2020

  1. Effect of the cap layer growth temperature on the Sb distribution in InAs/InSb/InAs sub-monolayer heterostructures for mid-infrared devices

    Nanotechnology, Vol. 31, Núm. 10

  2. Investigation on Sb distribution for InSb/InAs sub-monolayer heterostructure using TEM techniques

    Nanotechnology, Vol. 31, Núm. 2

2019

  1. Effect of the thermal annealing and the nominal composition in the elemental distribution of InxAl1-xAsySb1-y for triple junction solar cells

    Journal of Alloys and Compounds, Vol. 792, pp. 1021-1027

  2. Influence of the crosstalk on the intensity of HAADF-STEM images of quaternary semiconductor materials

    Journal of Microscopy, Vol. 273, Núm. 1, pp. 81-88

  3. Modified qHAADF method for atomic column-by-column compositional quantification of semiconductor heterostructures

    Journal of Materials Science, Vol. 54, Núm. 4, pp. 3230-3241

2018

  1. Gaussian kernel density functions for compositional quantification in atom probe tomography

    Materials Characterization, Vol. 139, pp. 63-69

  2. HAADF-STEM for the analysis of core–shell quantum dots

    Journal of Materials Science, Vol. 53, Núm. 21, pp. 15226-15236

  3. Influence of the growth temperature on the composition distribution at sub-nm scale of InAlAsSb for solar cells

    Journal of Alloys and Compounds, Vol. 763, pp. 1005-1011

2017

  1. Structural and Compositional Analysis of Core/Shell QDs by Transmission Electron Microscopy Techniques

    Microscopy & Microanalysis 2017

  2. Structural characterization of InAlAsSb/InGaAs/InP heterostructures for solar cells

    Applied Surface Science, Vol. 395, pp. 98-104

2014

  1. A methodology for the extraction of quantitative information from electron microscopy images at the atomic level

    Journal of Physics: Conference Series

  2. Analysis of electron beam damage of exfoliated MoS2 sheets and quantitative HAADF-STEM imaging

    Ultramicroscopy, Vol. 146, pp. 33-38

2012

  1. High-Resolution Electron Microscopy of Semiconductor Heterostructures and Nanostructures

    Springer Series in Materials Science (Springer Science and Business Media Deutschland GmbH), pp. 23-62

2011

  1. Compositional analysis with atomic column spatial resolution by 5th-order aberration-corrected scanning transmission electron microscopy

    Microscopy and Microanalysis, Vol. 17, Núm. 4, pp. 578-581

  2. Reduction of Channeling Effects in Aberration-Corrected STEM by Orientating the Sample Along Low Atomic Linear Density Zone Axes

    Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

2010

  1. Transmission electron microscopy study of vertical quantum dots molecules grown by droplet epitaxy

    Applied Surface Science, Vol. 256, Núm. 18, pp. 5659-5661

2009

  1. Atomic scale high-angle annular dark field STEM analysis of the N configuration in dilute nitrides of GaAs

    Physical Review B - Condensed Matter and Materials Physics, Vol. 80, Núm. 12

2008

  1. High resolution HAADF-STEM imaging analysis of N related defects in GaNAs quantum wells

    Microscopy and Microanalysis