Automática, Procesamiento de Señales e Ingenieria de Sistemas
TIC196
University of Johannesburg
Johannesburgo, SudáfricaPublications in collaboration with researchers from University of Johannesburg (1)
1995
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Determining the refractive index and average thickness of AsSe semiconducting glass films from wavelength measurements only
Applied Optics, Vol. 34, Núm. 34, pp. 7907-7913