PEDRO LUIS
GALINDO RIAÑO
Catedrático de Universidad
DAVID
SALES LERIDA
Profesor Titular de Universidad
Publications by the researcher in collaboration with DAVID SALES LERIDA (18)
2019
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Influence of the crosstalk on the intensity of HAADF-STEM images of quaternary semiconductor materials
Journal of Microscopy, Vol. 273, Núm. 1, pp. 81-88
2017
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Structural characterization of InAlAsSb/InGaAs/InP heterostructures for solar cells
Applied Surface Science, Vol. 395, pp. 98-104
2014
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A methodology for the extraction of quantitative information from electron microscopy images at the atomic level
Journal of Physics: Conference Series
2012
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High-Resolution Electron Microscopy of Semiconductor Heterostructures and Nanostructures
Springer Series in Materials Science (Springer Science and Business Media Deutschland GmbH), pp. 23-62
2011
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Calculation of integrated intensities in aberration-corrected Z-contrast images
Journal of Electron Microscopy, Vol. 60, Núm. 1, pp. 29-33
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Distribution of bismuth atoms in epitaxial GaAsBi
Applied Physics Letters, Vol. 98, Núm. 10
2010
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Morphological evolution of InAs/InP quantum wires through aberration-corrected scanning transmission electron microscopy
Nanotechnology, Vol. 21, Núm. 32
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Transmission electron microscopy study of vertical quantum dots molecules grown by droplet epitaxy
Applied Surface Science, Vol. 256, Núm. 18, pp. 5659-5661
2009
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Column-by-column compositional mapping by Z-contrast imaging
Ultramicroscopy, Vol. 109, Núm. 2, pp. 172-176
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Erratum to: "Column-by-column compositional mapping by Z-contrast imaging" [Ultramicroscopy 109(2) (2009) 172-176] (DOI:10.1016/j.ultramic.2008.10.008)
Ultramicroscopy
2008
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A method to determine the strain and nucleation sites of stacked nano-objects
Journal of Nanoscience and Nanotechnology, Vol. 8, Núm. 7, pp. 3422-3426
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Experimental and simulated strain field maps in stacked quantum wires
Microscopy and Microanalysis
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Simulation of high angle annular dark field scanning transmission electron microscopy images of large nanostructures
Applied Physics Letters, Vol. 93, Núm. 15
2007
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Critical strain region evaluation of self-assembled semiconductor quantum dots
Nanotechnology, Vol. 18, Núm. 47
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Determination of the Strain Field in Nano-Objects from Aberration-Corrected Z-contrast Images
Extended abstract of a paper presented at Microscopy and Microanalysis 2007 in Ft. Lauderdale, Florida, USA, August 5 – August 9, 2007
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Direct imaging of quantum wires nucleated at diatomic steps
Applied Physics Letters, Vol. 91, Núm. 14
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Incorporation of Sb in InAsGaAs quantum dots
Applied Physics Letters, Vol. 91, Núm. 26
2006
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Determination of the strain generated in InAs/InP quantum wires: Prediction of nucleation sites
Nanotechnology, Vol. 17, Núm. 22, pp. 5652-5658