EMILIO JOSE MARQUEZ NAVARRO-rekin lankidetzan egindako argitalpenak (6)

2022

  1. Energy-band-structure calculation by below-band-gap spectrophotometry in thin layers of non-crystalline semiconductors: A case study of unhydrogenated a-Si

    Journal of Non-Crystalline Solids, Vol. 594

2020

  1. Spectroscopic ellipsometry study of non-hydrogenated fully amorphous silicon films deposited by room-temperature radio-frequency magnetron sputtering on glass: Influence of the argon pressure

    Journal of Non-Crystalline Solids, Vol. 547

2019

  1. The influence of Ar pressure on the structure and optical properties of non-hydrogenated a-Si thin films grown by rf magnetron sputtering onto room-temperature glass substrates

    Journal of Non-Crystalline Solids, Vol. 517, pp. 32-43

2018

  1. Optimisation of the envelope method for characterisation of optical thin film on substrate specimens from their normal incidence transmittance spectrum

    Thin Solid Films, Vol. 645, pp. 370-378

2017

  1. Optical characterization of amine-solution-processed amorphous AsS2 chalcogenide thin films by the use of transmission spectroscopy

    Journal of Alloys and Compounds, Vol. 721, pp. 363-373

  2. Optimization of the graphical method of Swanepoel for characterization of thin film on substrate specimens from their transmittance spectrum

    Measurement Science and Technology, Vol. 28, Núm. 3