Publicaciones en las que colabora con PEDRO LUIS GALINDO RIAÑO (8)

2020

  1. CDrift: An Algorithm to Correct Linear Drift from A Single High-Resolution STEM Image

    Microscopy and Microanalysis, Vol. 26, Núm. 5, pp. 913-920

2019

  1. Topological homogeneity for electron microscopy images

    Lecture Notes in Computer Science (including subseries Lecture Notes in Artificial Intelligence and Lecture Notes in Bioinformatics)

2018

  1. Correcting sample drift using Fourier harmonics

    Micron, Vol. 110, pp. 18-27

2017

  1. Evaluation of high-quality image reconstruction techniques applied to high-resolution Z-contrast imaging

    Ultramicroscopy, Vol. 182, pp. 283-291

2016

  1. Strain mapping accuracy improvement using super-resolution techniques

    Journal of Microscopy, Vol. 262, Núm. 1, pp. 50-58

2012

  1. High-Resolution Electron Microscopy of Semiconductor Heterostructures and Nanostructures

    Springer Series in Materials Science (Springer Science and Business Media Deutschland GmbH), pp. 23-62

2009

  1. Atomic scale high-angle annular dark field STEM analysis of the N configuration in dilute nitrides of GaAs

    Physical Review B - Condensed Matter and Materials Physics, Vol. 80, Núm. 12

2008

  1. High resolution HAADF-STEM imaging analysis of N related defects in GaNAs quantum wells

    Microscopy and Microanalysis