Publications (21)

2020

  1. CDrift: An Algorithm to Correct Linear Drift from A Single High-Resolution STEM Image

    Microscopy and Microanalysis, Vol. 26, Núm. 5, pp. 913-920

2019

  1. Topological homogeneity for electron microscopy images

    Lecture Notes in Computer Science (including subseries Lecture Notes in Artificial Intelligence and Lecture Notes in Bioinformatics)

  2. AL4LA: Active Learning for Text Labeling Based on Paragraph Vectors

    Lecture Notes in Computer Science (including subseries Lecture Notes in Artificial Intelligence and Lecture Notes in Bioinformatics)

  3. HAADF-STEM Image Resolution Enhancement Using High-Quality Image Reconstruction Techniques: Case of the Fe3O4(111) Surface

    Microscopy and Microanalysis, Vol. 25, Núm. 6, pp. 1297-1303

2018

  1. Application of super-resolution techniques to transmission electron microscopy images

    Frontiers in Artificial Intelligence and Applications

  2. Product matching to determine the energy efficiency of used cars available at internet marketplaces

    Studies in Fuzziness and Soft Computing (Springer Verlag), pp. 203-215

  3. Correcting sample drift using Fourier harmonics

    Micron, Vol. 110, pp. 18-27

2017

  1. Using deep learning for image similarity in product matching

    Lecture Notes in Computer Science (including subseries Lecture Notes in Artificial Intelligence and Lecture Notes in Bioinformatics), Vol. 10305 LNCS, pp. 281-290

  2. Evaluation of high-quality image reconstruction techniques applied to high-resolution Z-contrast imaging

    Ultramicroscopy, Vol. 182, pp. 283-291

2016

  1. (S)TEM Analysis of the Strain and Morphology of InAs Quantum Dots using GaAs(Sb)(N) Capping Layers for Solar Cell Applications

    Microscopy and Microanalysis

  2. Strain mapping accuracy improvement using super-resolution techniques

    Journal of Microscopy, Vol. 262, Núm. 1, pp. 50-58

2014

  1. Observation of depth-dependent atomic displacements related to dislocations in GaN by optical sectioning in the STEM

    Journal of Physics: Conference Series

  2. A methodology for the extraction of quantitative information from electron microscopy images at the atomic level

    Journal of Physics: Conference Series

  3. Preferential sites for InAsP/InP quantum wire nucleation using molecular dynamics

    European Physical Journal B, Vol. 87, Núm. 11

  4. Direct observation of depth-dependent atomic displacements associated with dislocations in gallium nitride

    Physical Review Letters, Vol. 113, Núm. 13

2012

  1. High-Resolution Electron Microscopy of Semiconductor Heterostructures and Nanostructures

    Springer Series in Materials Science (Springer Science and Business Media Deutschland GmbH), pp. 23-62

  2. Effect Of The Eshelby-Stroh Twist In Dislocations In GaN Imaged End-On

    Microscopy and Microanalysis, Vol. 18, pp. 1338-1339

2011

  1. Reduction of Channeling Effects in Aberration-Corrected STEM by Orientating the Sample Along Low Atomic Linear Density Zone Axes

    Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

  2. Compositional analysis with atomic column spatial resolution by 5th-order aberration-corrected scanning transmission electron microscopy

    Microscopy and Microanalysis, Vol. 17, Núm. 4, pp. 578-581

2010

  1. Through-focal HAADF-STEM of buried nanostructures

    Journal of Physics: Conference Series