Francisco Javier García López-rekin lankidetzan egindako argitalpenak (3)

2018

  1. Comparison of the thickness determined by fresnel contrast and rutherford backscattering spectrometry in ultra-thin layers

    Microscopy of Semiconducting Materials 2003 (CRC Press), pp. 305-308

2004

  1. Comparison of the thickness determined by Fresnel contrast and Rutherford backscattering spectrometry in ultra-thin layers

    Design and Nature

2003

  1. Comparison of the thickness determined by Fresnel contrast and Rutherford backscattering spectrometry in ultra-thin layers

    MICROSCOPY OF SEMICONDUCTING MATERIALS 2003