Publications en collaboration avec des chercheurs de Tohoku University (5)

2002

  1. Influence of substrate absorption on the optical and geometrical characterization of thin dielectric films

    Applied Optics, Vol. 41, Núm. 34, pp. 7300-7308

2001

  1. Method for determining the optical constants of thin dielectric films with variable thickness using only their shrunk reflection spectra

    Journal of Physics D: Applied Physics, Vol. 34, Núm. 16, pp. 2489-2496

1999

  1. Optical constants in the subgap region and vibrational behaviour by far-infrared spectroscopy of wedge-shaped obliquely-deposited amorphous GeS2 films

    Physica Scripta, Vol. 60, Núm. 1, pp. 90-96

1998

  1. A new method for the optical characterization of inhomogeneous thin films based only on spectroscopic reflection measurements

    Materials Science Forum, Vol. 287-288, pp. 363-366

  2. Optical characterization of thermally evaporated thin films of As40S40Se20 chalcogenide glass by reflectance measurements

    Applied Physics A: Materials Science and Processing, Vol. 67, Núm. 3, pp. 371-378