Publicacións nas que colabora con EMILIO JOSE MARQUEZ NAVARRO (10)

2023

  1. Complex dielectric function of H-free a-Si films: Photovoltaic light absorber

    Materials Letters, Vol. 345

2022

  1. Application of the Holomorphic Tauc-Lorentz-Urbach Function to Extract the Optical Constants of Amorphous Semiconductor Thin Films

    Coatings, Vol. 12, Núm. 10

  2. Comparison of Optical Characterization Methods for Transmission Spectroscopy

    Optics InfoBase Conference Papers

  3. Energy-band-structure calculation by below-band-gap spectrophotometry in thin layers of non-crystalline semiconductors: A case study of unhydrogenated a-Si

    Journal of Non-Crystalline Solids, Vol. 594

2021

  1. Optical characterization of H-free a-Si layers grown by rf-magnetron sputtering by inverse synthesis using matlab: Tauc–lorentz–urbach parameterization

    Coatings, Vol. 11, Núm. 11

2020

  1. Spectroscopic ellipsometry study of non-hydrogenated fully amorphous silicon films deposited by room-temperature radio-frequency magnetron sputtering on glass: Influence of the argon pressure

    Journal of Non-Crystalline Solids, Vol. 547

2019

  1. The influence of Ar pressure on the structure and optical properties of non-hydrogenated a-Si thin films grown by rf magnetron sputtering onto room-temperature glass substrates

    Journal of Non-Crystalline Solids, Vol. 517, pp. 32-43

2018

  1. Optimisation of the envelope method for characterisation of optical thin film on substrate specimens from their normal incidence transmittance spectrum

    Thin Solid Films, Vol. 645, pp. 370-378

2017

  1. Optical characterization of amine-solution-processed amorphous AsS2 chalcogenide thin films by the use of transmission spectroscopy

    Journal of Alloys and Compounds, Vol. 721, pp. 363-373

  2. Optimization of the graphical method of Swanepoel for characterization of thin film on substrate specimens from their transmittance spectrum

    Measurement Science and Technology, Vol. 28, Núm. 3