Instituto de Microscopía Electrónica y Materiales (IMEYMAT)
Forschungsinstitut
University System of Ohio
Columbus, Estados UnidosPublikationen in Zusammenarbeit mit Forschern von University System of Ohio (1)
1999
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Effect of the temperature ramp rate during carbonization of Si (111) on the crystalline quality of SiC produced
MICROSCOPY OF SEMICONDUCTING MATERIALS 1999, PROCEEDINGS