Instituto de Microscopía Electrónica y Materiales (IMEYMAT)
Instituto de investigación
Center for Scientific Research and Higher Education at Ensenada
Ensenada, MéxicoPublicaciones en colaboración con investigadores/as de Center for Scientific Research and Higher Education at Ensenada (3)
2023
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O3-Annealing Effect on the Etching Resilience of a TiO2/Al2O3 filter Prepared by Atomic Layer Deposition
ACS Applied Materials and Interfaces, Vol. 15, Núm. 34, pp. 40942-40953
2022
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Spectroscopic Ellipsometry Study on Tuning the Electrical and Optical Properties of Zr-Doped ZnO Thin Films Grown by Atomic Layer Deposition
ACS Applied Electronic Materials, Vol. 4, Núm. 3, pp. 925-935
2003
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A method for computing the characteristic impedance of transmission lines using the wave cascade matrix formalism
61st ARFTG Conference Digest Spring 2003: Measurement Accuracy, ARFTG Spring 2003