Determining the refractive index and average thickness of AsSe semiconducting glass films from wavelength measurements only

  1. Corrales, C.
  2. Ramírez-Malo, J.B.
  3. Fernández-Peña, J.
  4. Villares, P.
  5. Swanepoel, R.
  6. Márquez, E.
Aldizkaria:
Applied Optics

ISSN: 2155-3165,  1559-128X

Argitalpen urtea: 1995

Alea: 34

Zenbakia: 34

Orrialdeak: 7907-7913

Mota: Artikulua

DOI: 10.1364/AO.34.007907 GOOGLE SCHOLAR
Datuen iturria: Scopus