High resolution HAADF-STEM imaging analysis of N related defects in GaNAs quantum wells

  1. Herrera, M.
  2. Ramasse, Q.
  3. Browning, N.D.
  4. Pizarro, J.
  5. Galindo, P.L.
  6. Gonzalez, D.
  7. Garcia, R.
  8. Du, M.W.
  9. Zhang, S.B.
  10. Hopkinson, M.
Journal:
Microscopy and Microanalysis

ISSN: 1431-9276,  1435-8115

Year of publication: 2008

Volume: 14

Issue: SUPPL. 2

Pages: 318-319

Type: Conference paper

DOI: 10.1017/S1431927608082329 GOOGLE SCHOLAR
Data source: Scopus