Quantitative strain mapping applied to aberration-corrected HAADF images

  1. Sanchez, A.M.
  2. Galindo, P.L.
  3. Kret, S.
  4. Falke, M.
  5. Beanland, R.
  6. Goodhew, P.J.
Revue:
Microscopy and Microanalysis

ISSN: 1431-9276,  1435-8115

Année de publication: 2006

Volumen: 12

Número: 4

Pages: 285-294

Type: Article

DOI: 10.1017/S1431927606060363 GOOGLE SCHOLAR
La source de données: Scopus