Optimization of the graphical method of Swanepoel for characterization of thin film on substrate specimens from their transmittance spectrum

  1. Minkov, D.A.
  2. Gavrilov, G.M.
  3. Moreno, J.M.D.
  4. Vazquez, C.G.
  5. Marquez, E.
Revista:
Measurement Science and Technology

ISSN: 1361-6501,  0957-0233

Any de publicació: 2017

Volum: 28

Número: 3

Tipus: Article

DOI: 10.1088/1361-6501/AA54F6 GOOGLE SCHOLAR
Font de les dades: Scopus