Optimization of the graphical method of Swanepoel for characterization of thin film on substrate specimens from their transmittance spectrum

  1. Minkov, D.A.
  2. Gavrilov, G.M.
  3. Moreno, J.M.D.
  4. Vazquez, C.G.
  5. Marquez, E.
Revue:
Measurement Science and Technology

ISSN: 1361-6501,  0957-0233

Année de publication: 2017

Volumen: 28

Número: 3

Type: Article

DOI: 10.1088/1361-6501/AA54F6 GOOGLE SCHOLAR
La source de données: Scopus