Optimization of the graphical method of Swanepoel for characterization of thin film on substrate specimens from their transmittance spectrum

  1. Minkov, D.A.
  2. Gavrilov, G.M.
  3. Moreno, J.M.D.
  4. Vazquez, C.G.
  5. Marquez, E.
Journal:
Measurement Science and Technology

ISSN: 1361-6501,  0957-0233

Year of publication: 2017

Volume: 28

Issue: 3

Type: Article

DOI: 10.1088/1361-6501/AA54F6 GOOGLE SCHOLAR
Data source: Scopus