Optimization of the graphical method of Swanepoel for characterization of thin film on substrate specimens from their transmittance spectrum

  1. Minkov, D.A.
  2. Gavrilov, G.M.
  3. Moreno, J.M.D.
  4. Vazquez, C.G.
  5. Marquez, E.
Aldizkaria:
Measurement Science and Technology

ISSN: 1361-6501,  0957-0233

Argitalpen urtea: 2017

Alea: 28

Zenbakia: 3

Mota: Artikulua

DOI: 10.1088/1361-6501/AA54F6 GOOGLE SCHOLAR
Datuen iturria: Scopus