Electron microscopy study of SiC obtained by the carbonization of Si(111)

  1. Pacheco, F.J.
  2. Sánchez, A.M.
  3. Molina, S.I.
  4. Araújo, D.
  5. Devrajan, J.
  6. Steckl, A.J.
  7. García, R.
Revue:
Thin Solid Films

ISSN: 0040-6090

Année de publication: 1999

Volumen: 343-344

Número: 1-2

Pages: 305-308

Type: Article

DOI: 10.1016/S0040-6090(98)01589-2 GOOGLE SCHOLAR
La source de données: Scopus