Effect of dislocations on electrical and electron transport properties of InN thin films. I. Strain relief and formation of a dislocation network

1. Lebedev, V.
2. Cimalla, V.
3. Pezoldt, J.
4. Himmerlich, M.
5. Krischok, S.
6. Schaefer, J.A.
7. Ambacher, O.
8. Morales, F.M.
9. Lozano, J.G.
10. González, D.