Electron tomography using compositional-sensitive diffraction contrast for 3D characterization of self-assembled semiconductor quantum dots
- Beanland, R.
- Hernandez, J.C.
- Sanchez, A.M.
- Midgley, P.A.
ISSN: 1431-9276, 1435-8115
Year of publication: 2008
Volume: 14
Issue: SUPPL. 2
Pages: 1052-1053
Type: Conference paper