Electron tomography using compositional-sensitive diffraction contrast for 3D characterization of self-assembled semiconductor quantum dots

  1. Beanland, R.
  2. Hernandez, J.C.
  3. Sanchez, A.M.
  4. Midgley, P.A.
Revue:
Microscopy and Microanalysis

ISSN: 1431-9276,  1435-8115

Année de publication: 2008

Volumen: 14

Número: SUPPL. 2

Pages: 1052-1053

Type: Communication dans un congrès

DOI: 10.1017/S1431927608088107 GOOGLE SCHOLAR
La source de données: Scopus