Electron tomography using compositional-sensitive diffraction contrast for 3D characterization of self-assembled semiconductor quantum dots

  1. Beanland, R.
  2. Hernandez, J.C.
  3. Sanchez, A.M.
  4. Midgley, P.A.
Aldizkaria:
Microscopy and Microanalysis

ISSN: 1431-9276,  1435-8115

Argitalpen urtea: 2008

Alea: 14

Zenbakia: SUPPL. 2

Orrialdeak: 1052-1053

Mota: Biltzar ekarpena

DOI: 10.1017/S1431927608088107 GOOGLE SCHOLAR
Datuen iturria: Scopus