Quantification of the influence of TEM operation parameters on the error of HREM image matching

  1. Pizarro, J.
  2. Guerrero, E.
  3. Galindo, P.
  4. Yanez, A.
  5. Ben, T.
  6. Molina, S. I.
Book Series:
MICROSCOPY OF SEMICONDUCTING MATERIALS
  1. Cullis, AG (coord.)
  2. Hutchison, JL (coord.)

ISSN: 0930-8989,  1867-4941

ISBN: 3-540-31914-X

Year of publication: 2005

Volume: 107

Pages: 195-198

Congress: 14th Conference on Microscopy of Semiconducting Materials

Type: Conference paper

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Data source: WoS