Quantification of the influence of TEM operation parameters on the error of HREM image matching

  1. Pizarro, J.
  2. Guerrero, E.
  3. Galindo, P.
  4. Yanez, A.
  5. Ben, T.
  6. Molina, S. I.
Liburu bilduma:
MICROSCOPY OF SEMICONDUCTING MATERIALS
  1. Cullis, AG (coord.)
  2. Hutchison, JL (coord.)

ISSN: 0930-8989,  1867-4941

ISBN: 3-540-31914-X

Argitalpen urtea: 2005

Alea: 107

Orrialdeak: 195-198

Biltzarra: 14th Conference on Microscopy of Semiconducting Materials

Mota: Biltzar ekarpena

GOOGLE SCHOLAR
Datuen iturria: WoS