Publicaciones en las que colabora con PEDRO LUIS GALINDO RIAÑO (27)

2020

  1. CDrift: An Algorithm to Correct Linear Drift from A Single High-Resolution STEM Image

    Microscopy and Microanalysis, Vol. 26, Núm. 5, pp. 913-920

2019

  1. AL4LA: Active Learning for Text Labeling Based on Paragraph Vectors

    Lecture Notes in Computer Science (including subseries Lecture Notes in Artificial Intelligence and Lecture Notes in Bioinformatics)

  2. HAADF-STEM Image Resolution Enhancement Using High-Quality Image Reconstruction Techniques: Case of the Fe3O4(111) Surface

    Microscopy and Microanalysis, Vol. 25, Núm. 6, pp. 1297-1303

  3. OPEN-DESIGN ROV: A MULTIDISCIPLINARY AND COLLABORATIVE PROJECT AMONG DIFFERENT AREAS OF KNOWLEDGE

    12TH INTERNATIONAL CONFERENCE OF EDUCATION, RESEARCH AND INNOVATION (ICERI 2019)

2018

  1. Application of super-resolution techniques to transmission electron microscopy images

    Frontiers in Artificial Intelligence and Applications

  2. Correcting sample drift using Fourier harmonics

    Micron, Vol. 110, pp. 18-27

2017

  1. Evaluation of high-quality image reconstruction techniques applied to high-resolution Z-contrast imaging

    Ultramicroscopy, Vol. 182, pp. 283-291

2014

  1. A methodology for the extraction of quantitative information from electron microscopy images at the atomic level

    Journal of Physics: Conference Series

  2. Preferential sites for InAsP/InP quantum wire nucleation using molecular dynamics

    European Physical Journal B, Vol. 87, Núm. 11

2011

  1. Genetic algorithms applied to the design of 3D photonic crystals

    Lecture Notes in Computer Science (including subseries Lecture Notes in Artificial Intelligence and Lecture Notes in Bioinformatics)

2010

  1. Three-dimensional acoustic lenses with axial symmetry

    Applied Physics Letters, Vol. 97, Núm. 5

  2. Through-focal HAADF-STEM of buried nanostructures

    Journal of Physics: Conference Series

2009

  1. Accuracy assessment of strain mapping from Z -contrast images of strained nanostructures

    Applied Physics Letters, Vol. 95, Núm. 14

  2. Atomic scale high-angle annular dark field STEM analysis of the N configuration in dilute nitrides of GaAs

    Physical Review B - Condensed Matter and Materials Physics, Vol. 80, Núm. 12

2008

  1. Simulation of high angle annular dark field scanning transmission electron microscopy images of large nanostructures

    Applied Physics Letters, Vol. 93, Núm. 15

2007

  1. Error quantification in strain mapping methods

    Microscopy and Microanalysis, Vol. 13, Núm. 5, pp. 320-328

  2. The Peak Pairs algorithm for strain mapping from HRTEM images

    Ultramicroscopy, Vol. 107, Núm. 12, pp. 1186-1193

2005

  1. Quantification of the influence of TEM operation parameters on the error of HREM image matching

    14th Conference, April 11-14, 2005, Oxford, UK

  2. Statistical Ensemble Method (SEM): A new meta-machine learning approach based on statistical techniques

    Lecture Notes in Computer Science

2004

  1. Model selection methods in Multilayer Perceptions

    IEEE International Conference on Neural Networks - Conference Proceedings