Publicaciones en colaboración con investigadores/as de Philips Research Eindhoven (5)

2004

  1. Porosity in silicon and silica thin films monitored by positrons and positronium

    Materials Science Forum

2003

  1. Depth-selective 2D-ACAR studies on low-k dielectric thin films

    Radiation Physics and Chemistry

  2. Nano-porosity in silica reinforced methyltrimethoxysilane coatings studied by positron beam analysis

    Composites Science and Technology, Vol. 63, Núm. 8, pp. 1133-1139

  3. Positron beam analysis of structurally ordered porosity in mesoporous silica thin films

    Materials Science and Engineering B: Solid-State Materials for Advanced Technology

  4. Systematic positron study of hydrophilicity of the internal pore surface in ordered low-k silica thin films

    Materials Science and Engineering B: Solid-State Materials for Advanced Technology