Ikerketa proiektua
MOIF-CT-2006-021423
New methodology for the characterisation of semiconductor self-assambled nanostructures with optoelectronic applications
date_range
Iraupena 2006(e)ko apirila-(a)k 01-(e)tik 2009(e)ko martxoa-(a)k 31-(e)ra izan da
(36 months)
Deialdi:
3972
Sexto Programa Marco de la Unión Europea. Programas Europeos