Francisco Javier
García López
Publicacions en què col·labora amb Francisco Javier García López (4)
2018
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Comparison of the thickness determined by fresnel contrast and rutherford backscattering spectrometry in ultra-thin layers
Microscopy of Semiconducting Materials 2003 (CRC Press), pp. 305-308
2009
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MEMS solar sensor testing for satellite applications
PROCEEDINGS OF THE 2009 SPANISH CONFERENCE ON ELECTRON DEVICES
2004
2003
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Comparison of the thickness determined by Fresnel contrast and Rutherford backscattering spectrometry in ultra-thin layers
MICROSCOPY OF SEMICONDUCTING MATERIALS 2003