Francisco Javier García López-rekin lankidetzan egindako argitalpenak (4)

2018

  1. Comparison of the thickness determined by fresnel contrast and rutherford backscattering spectrometry in ultra-thin layers

    Microscopy of Semiconducting Materials 2003 (CRC Press), pp. 305-308

2009

  1. MEMS solar sensor testing for satellite applications

    PROCEEDINGS OF THE 2009 SPANISH CONFERENCE ON ELECTRON DEVICES

2004

  1. Comparison of the thickness determined by Fresnel contrast and Rutherford backscattering spectrometry in ultra-thin layers

    Design and Nature

2003

  1. Comparison of the thickness determined by Fresnel contrast and Rutherford backscattering spectrometry in ultra-thin layers

    MICROSCOPY OF SEMICONDUCTING MATERIALS 2003