Ciencia de los Materiales e Ingeniería Metalúrgica y Química Inorgánica

2003

1. Microstructural study of CO 2 laser machined heat affected zone of 2024 aluminum alloy

   Applied Surface Science

2. A method for computing the characteristic impedance of transmission lines using the wave cascade matrix formalism

   61st ARFTG Conference Digest Spring 2003: Measurement Accuracy, ARFTG Spring 2003

3. Anomalous relaxation in combined low and high temperature growth of InGaAs/GaAs epilayers

   MICROSCOPY OF SEMICONDUCTING MATERIALS 2003

4. Characterization of InGaAs (N)/GaAsN multi-quantum wells using transmission electron microscopy

   MICROSCOPY OF SEMICONDUCTING MATERIALS 2003

5. Comparative TEM Investigation of MBE and RTCVD Conversion of Si into SiC

   Materials Science Forum

6. Comparison of the thickness determined by Fresnel contrast and Rutherford backscattering spectrometry in ultra-thin layers

   MICROSCOPY OF SEMICONDUCTING MATERIALS 2003

7. Correlation between the AlN buffer layer thickness and the GaN polarity in GaN/AlN/Si(111) grown by MBE

   GAN AND RELATED ALLOYS-2002

8. Fatigue behaviour of laser machined 2024 T3 aeronautic aluminium alloy

   Applied Surface Science

9. Neural networks applied to the determination of thickness and defocus from high resolution transmission electron microscopy images

   MICROSCOPY OF SEMICONDUCTING MATERIALS 2003

10. On the application of advanced computing techniques for the determination of thickness and defocus from high resolution transmission electron microscopy images

    10th International Ceramics Congress and 3rd Forum on New Materials, Florence, Italy, July 14-18, 2002

11. Size and critical thickness evolution during growth of stacked layers of InAs/InP(001) quantum wires studied by in situ stress measurements

    Materials Research Society Symposium - Proceedings

12. Size self-filtering effect in vertical stacks of InAs/InP self-assembled quantum wires

    Physica E: Low-Dimensional Systems and Nanostructures

13. Some contributions of electron microscopy to the characterisation of the strong metal-support interaction effect

    Catalysis Today

14. Structural Study of GaN Layers Grown on Carbonized Si(111) Substrates

    Materials Science Forum

15. Thickness influence on spinodal decomposition in In0.2Ga0.8As/GaAs low temperature growth

    MICROSCOPY OF SEMICONDUCTING MATERIALS 2003

16. Transmission electron microscopy study of ultra-thin SiC layers obtained by rapid thermal carbonization of Si wafers

    Physica Status Solidi (A) Applied Research

17. Treatment, by zeolitic products, for the elimination of ammonium contained in water of different salinities

    Progress in Water Resources