Departamento
Ciencia de los Materiales e Ingeniería Metalúrgica y Química Inorgánica
Aportaciones congreso (17) Publicaciones en las que ha participado algún/a investigador/a
2003
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Microstructural study of CO 2 laser machined heat affected zone of 2024 aluminum alloy
Applied Surface Science
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A method for computing the characteristic impedance of transmission lines using the wave cascade matrix formalism
61st ARFTG Conference Digest Spring 2003: Measurement Accuracy, ARFTG Spring 2003
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Anomalous relaxation in combined low and high temperature growth of InGaAs/GaAs epilayers
MICROSCOPY OF SEMICONDUCTING MATERIALS 2003
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Characterization of InGaAs (N)/GaAsN multi-quantum wells using transmission electron microscopy
MICROSCOPY OF SEMICONDUCTING MATERIALS 2003
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Comparative TEM Investigation of MBE and RTCVD Conversion of Si into SiC
Materials Science Forum
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Comparison of the thickness determined by Fresnel contrast and Rutherford backscattering spectrometry in ultra-thin layers
MICROSCOPY OF SEMICONDUCTING MATERIALS 2003
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Correlation between the AlN buffer layer thickness and the GaN polarity in GaN/AlN/Si(111) grown by MBE
GAN AND RELATED ALLOYS-2002
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Fatigue behaviour of laser machined 2024 T3 aeronautic aluminium alloy
Applied Surface Science
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Neural networks applied to the determination of thickness and defocus from high resolution transmission electron microscopy images
MICROSCOPY OF SEMICONDUCTING MATERIALS 2003
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On the application of advanced computing techniques for the determination of thickness and defocus from high resolution transmission electron microscopy images
10th International Ceramics Congress and 3rd Forum on New Materials, Florence, Italy, July 14-18, 2002
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Size and critical thickness evolution during growth of stacked layers of InAs/InP(001) quantum wires studied by in situ stress measurements
Materials Research Society Symposium - Proceedings
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Size self-filtering effect in vertical stacks of InAs/InP self-assembled quantum wires
Physica E: Low-Dimensional Systems and Nanostructures
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Some contributions of electron microscopy to the characterisation of the strong metal-support interaction effect
Catalysis Today
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Structural Study of GaN Layers Grown on Carbonized Si(111) Substrates
Materials Science Forum
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Thickness influence on spinodal decomposition in In0.2Ga0.8As/GaAs low temperature growth
MICROSCOPY OF SEMICONDUCTING MATERIALS 2003
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Transmission electron microscopy study of ultra-thin SiC layers obtained by rapid thermal carbonization of Si wafers
Physica Status Solidi (A) Applied Research
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Treatment, by zeolitic products, for the elimination of ammonium contained in water of different salinities
Progress in Water Resources