Publicaciones en colaboración con investigadores/as de Tohoku University (5)

2002

  1. Influence of substrate absorption on the optical and geometrical characterization of thin dielectric films

    Applied Optics, Vol. 41, Núm. 34, pp. 7300-7308

2001

  1. Method for determining the optical constants of thin dielectric films with variable thickness using only their shrunk reflection spectra

    Journal of Physics D: Applied Physics, Vol. 34, Núm. 16, pp. 2489-2496

1999

  1. Optical constants in the subgap region and vibrational behaviour by far-infrared spectroscopy of wedge-shaped obliquely-deposited amorphous GeS2 films

    Physica Scripta, Vol. 60, Núm. 1, pp. 90-96

1998

  1. A new method for the optical characterization of inhomogeneous thin films based only on spectroscopic reflection measurements

    Materials Science Forum, Vol. 287-288, pp. 363-366

  2. Optical characterization of thermally evaporated thin films of As40S40Se20 chalcogenide glass by reflectance measurements

    Applied Physics A: Materials Science and Processing, Vol. 67, Núm. 3, pp. 371-378