Instituto de Microscopía Electrónica y Materiales (IMEYMAT)
Instituto de investigación
ANDRES
YAÑEZ ESCOLANO
Profesor Titular de Universidad
Publicaciones en las que colabora con ANDRES YAÑEZ ESCOLANO (15)
2022
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Tailoring of AlAs/InAs/GaAs QDs Nanostructures via Capping Growth Rate
Nanomaterials, Vol. 12, Núm. 14
2020
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CDrift: An Algorithm to Correct Linear Drift from A Single High-Resolution STEM Image
Microscopy and Microanalysis, Vol. 26, Núm. 5, pp. 913-920
2018
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Application of super-resolution techniques to transmission electron microscopy images
Frontiers in Artificial Intelligence and Applications
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Correcting sample drift using Fourier harmonics
Micron, Vol. 110, pp. 18-27
2017
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Evaluation of high-quality image reconstruction techniques applied to high-resolution Z-contrast imaging
Ultramicroscopy, Vol. 182, pp. 283-291
2014
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A methodology for the extraction of quantitative information from electron microscopy images at the atomic level
Journal of Physics: Conference Series
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Preferential sites for InAsP/InP quantum wire nucleation using molecular dynamics
European Physical Journal B, Vol. 87, Núm. 11
2010
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Through-focal HAADF-STEM of buried nanostructures
Journal of Physics: Conference Series
2009
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Accuracy assessment of strain mapping from Z -contrast images of strained nanostructures
Applied Physics Letters, Vol. 95, Núm. 14
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Atomic scale high-angle annular dark field STEM analysis of the N configuration in dilute nitrides of GaAs
Physical Review B - Condensed Matter and Materials Physics, Vol. 80, Núm. 12
2008
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Simulation of high angle annular dark field scanning transmission electron microscopy images of large nanostructures
Applied Physics Letters, Vol. 93, Núm. 15
2007
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Error quantification in strain mapping methods
Microscopy and Microanalysis, Vol. 13, Núm. 5, pp. 320-328
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The Peak Pairs algorithm for strain mapping from HRTEM images
Ultramicroscopy, Vol. 107, Núm. 12, pp. 1186-1193
2005
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Quantification of the influence of TEM operation parameters on the error of HREM image matching
14th Conference, April 11-14, 2005, Oxford, UK
2003
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On the application of advanced computing techniques for the determination of thickness and defocus from high resolution transmission electron microscopy images
10th International Ceramics Congress and 3rd Forum on New Materials, Florence, Italy, July 14-18, 2002