Boron concentration profiling by high angle annular dark field-scanning transmission electron microscopy in homoepitaxial δ-doped diamond layers

1. Araújo, D.
2. Alegre, M.P.
3. Piñero, J.C.
4. Fiori, A.
5. Bustarret, E.
6. Jomard, F.

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DOI: 10.1063/1.4816418 GOOGLE SCHOLAR lock_openOpen access editor

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