Boron concentration profiling by high angle annular dark field-scanning transmission electron microscopy in homoepitaxial δ-doped diamond layers
- Araújo, D.
- Alegre, M.P.
- Piñero, J.C.
- Fiori, A.
- Bustarret, E.
- Jomard, F.
Aldizkaria:
Applied Physics Letters
ISSN: 0003-6951
Argitalpen urtea: 2013
Alea: 103
Zenbakia: 4
Mota: Artikulua
