XPS analysis and microstructural characterization of a Ce/Tb mixed oxide supported on a lanthana-modified transition alumina

  1. Galtayries, A.
  2. Blanco, G.
  3. Cifredo, G.A.
  4. Finol, D.
  5. Gatica, J.M.
  6. Pintado, J.M.
  7. Vidal, H.
  8. Sporken, R.
  9. Bernal, S.
Journal:
Surface and Interface Analysis

ISSN: 0142-2421

Year of publication: 1999

Volume: 27

Issue: 10

Pages: 941-949

Type: Article

DOI: 10.1002/(SICI)1096-9918(199910)27:10<941::AID-SIA657>3.0.CO;2-Y GOOGLE SCHOLAR
Data source: Scopus