XPS analysis and microstructural characterization of a Ce/Tb mixed oxide supported on a lanthana-modified transition alumina

  1. Galtayries, A.
  2. Blanco, G.
  3. Cifredo, G.A.
  4. Finol, D.
  5. Gatica, J.M.
  6. Pintado, J.M.
  7. Vidal, H.
  8. Sporken, R.
  9. Bernal, S.
Aldizkaria:
Surface and Interface Analysis

ISSN: 0142-2421

Argitalpen urtea: 1999

Alea: 27

Zenbakia: 10

Orrialdeak: 941-949

Mota: Artikulua

DOI: 10.1002/(SICI)1096-9918(199910)27:10<941::AID-SIA657>3.0.CO;2-Y GOOGLE SCHOLAR
Datuen iturria: Scopus