XPS analysis and microstructural characterization of a Ce/Tb mixed oxide supported on a lanthana-modified transition alumina

  1. Galtayries, A.
  2. Blanco, G.
  3. Cifredo, G.A.
  4. Finol, D.
  5. Gatica, J.M.
  6. Pintado, J.M.
  7. Vidal, H.
  8. Sporken, R.
  9. Bernal, S.
Revue:
Surface and Interface Analysis

ISSN: 0142-2421

Année de publication: 1999

Volumen: 27

Número: 10

Pages: 941-949

Type: Article

DOI: 10.1002/(SICI)1096-9918(199910)27:10<941::AID-SIA657>3.0.CO;2-Y GOOGLE SCHOLAR
La source de données: Scopus