Development of algorithm for computer drawing envelopes of interference reflectance spectra for thin film specimens

  1. Minkov, D.A.
  2. Gavrilov, G.M.
  3. Marquez, E.
  4. Ruano, S.M.F.
  5. Stoynova, A.V.
Journal:
Optik

ISSN: 0030-4026

Year of publication: 2017

Volume: 132

Pages: 320-328

Type: Article

DOI: 10.1016/J.IJLEO.2016.12.063 GOOGLE SCHOLAR

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