Development of algorithm for computer drawing envelopes of interference reflectance spectra for thin film specimens

  1. Minkov, D.A.
  2. Gavrilov, G.M.
  3. Marquez, E.
  4. Ruano, S.M.F.
  5. Stoynova, A.V.
Aldizkaria:
Optik

ISSN: 0030-4026

Argitalpen urtea: 2017

Alea: 132

Orrialdeak: 320-328

Mota: Artikulua

DOI: 10.1016/J.IJLEO.2016.12.063 GOOGLE SCHOLAR