Development of algorithm for computer drawing envelopes of interference reflectance spectra for thin film specimens
- Minkov, D.A.
- Gavrilov, G.M.
- Marquez, E.
- Ruano, S.M.F.
- Stoynova, A.V.
Revue:
Optik
ISSN: 0030-4026
Année de publication: 2017
Volumen: 132
Pages: 320-328
Type: Article
