Development of algorithm for computer drawing envelopes of interference reflectance spectra for thin film specimens
- Minkov, D.A.
- Gavrilov, G.M.
- Marquez, E.
- Ruano, S.M.F.
- Stoynova, A.V.
Revista:
Optik
ISSN: 0030-4026
Ano de publicación: 2017
Volume: 132
Páxinas: 320-328
Tipo: Artigo