Analysis of short-range order and structural model in the glassy semiconductor Ge0.20Sb0.20Se0.60 by X-ray diffraction

  1. Quiroga, I.
  2. Vázquez, J.
  3. Villares, P.
  4. Jiménez-Garay, R.
Journal:
Materials Letters

ISSN: 0167-577X

Year of publication: 1993

Volume: 17

Issue: 6

Pages: 333-340

Type: Article

DOI: 10.1016/0167-577X(93)90121-D GOOGLE SCHOLAR
Data source: Scopus