Analysis of short-range order and structural model in the glassy semiconductor Ge0.20Sb0.20Se0.60 by X-ray diffraction
- Quiroga, I.
- Vázquez, J.
- Villares, P.
- Jiménez-Garay, R.
ISSN: 0167-577X
Année de publication: 1993
Volumen: 17
Número: 6
Pages: 333-340
Type: Article